Description
Broad audience of AFM users, from technicians to post-doctoral scientists to graduate students in nanotechnology and materials science/characterization,�
Also can be used to facilitate short courses for a wide range of researchers within industrial and academic settings who seek training on technique fundamentals, instrumentation and applications.
Typham this is the title: Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications Understanding Basic Modes and Advanced Applications 1st Edition
Reviews
There are no reviews yet.