vbid/9783540279228

$319.00

Author(s): Stefan Rein
Publisher: Springer
ISBN: 9783540253037
Edition:

Category:

Description

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.Typham this is the title: Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications

Reviews

There are no reviews yet.

Be the first to review “vbid/9783540279228”

Your email address will not be published. Required fields are marked *