vbid/9789814411592

$160.00

Author(s): Kunio Takeyasu
Publisher: Jenny Stanford Publishing
ISBN: 9789814411585
Edition: 1st Edition

Category:

Description

Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and force measurement. All these techniques are now highlyTypham this is the title: Atomic Force Microscopy in Nanobiology 1st Edition

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